专利名称：Method and apparatus for testing,
characterizing and monitoring a chipinterface using a second data path
发明人：Alfredo Aldereguia,Brian Lee Koehler,Grace
Ann Richter
申请号：US11064752申请日：20050224
公开号：US20060190642A1公开日：20060824
专利附图：
摘要：A data receiver circuit in a receiving chip provides the capability to characterize
an interface, which includes one or more inter-chip communication lines, between atransmitting chip and the receiving chip by transmitting the data across a primary datapath and a secondary data path, latching the data in the secondary data path using aclock signal that is skewed relative to a clock signal used to latch the primary data path,comparing the data latched from the primary and secondary data paths, and recordingerrors. Because the primary data path is not impacted by the test cycle, the test cyclemay be run while data associated with applications running on the system are transmittedacross the inter-chip communication lines.
申请人：Alfredo Aldereguia,Brian Lee Koehler,Grace Ann Richter
地址：Cary NC US,Rochester MN US,Chapel Hill NC US
国籍：US,US,US
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